TCT ASIA

19 - 21 FEBRUARY 2020

SNIEC, SHANGHAI,CHINA

TCT ASIA SUMMIT

WORKSHOPS

February 21 15:30 pm -16:00 pm

Topic: The Characterization Parameter and Measurement Method of Particles Used in Additional Manufacture

Outline:

1.backgroud

2.parameters, calibration, and valid data

3.summary


Speaker's Biography

Dr. Lingling Ren, the Leader of advanced materials metrology Lab.APMP/TCMM Chair-elect, VAMAS/TWA41 co-Chair, the delegate of ISO/TC229. IEC/TC113, Secretary of SAC/TC279/WG5 and CSTM/FC00. As primary project leader in charge of a National Program of Science and Technology (NQI). More than 10 certified reference materials have been completed, 6 international comparisons under VAMAS and APMP/TCMM are led to be going. 3 awards were owned.



Lingling Ren

Lingling Ren

National Institute of Metrology, China (NIM)

Topic: The Characterization Parameter and Measurement Method of Particles Used in Additional Manufacture

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